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TecView™ BT

Software / TecView™ BT

Bond Testing

TecView™ BT

TecView™ BT is a true Windows® based software designed for non-destructive Bond Testing inspections, from data Acquisition to data Analysis. It is designed for inspection of bond quality of aerospace composite materials. With its intuitive interface, the TecView BT automates the process of bond testing. It records the output signal of a bond testing instrument and provides C-Scan imaging capabilities, which would allow more intuitive and accurate analysis possibilities in terms of defect detection, sizing and positioning. C-Scan imaging can provide useful additional data that can complement the results of specialized non-destructive bond testing. In addition, C-scan imaging provides an intuitive representation of the inspection data that allows recognizing geometrical patterns within multiple readings.

 

TecView™ BT automates the process of bond testing !

Performs resonance and mechanical impedance analysis

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TecView BT ACQUISITION

TecView™ BT ACQUISITION is designed to handle the whole inspection process and could perform resonance and mechanical impedance analysis. This Module aids the user in the setup of all scanning parameters and includes an impedance plot section where different types of alarms can be set at once. Once all the parameters are set and the scan is started, the C-Scan, impedance plot and triggered alarms are displayed in Real-Time. A side ruler can be displayed in either Metric or Imperial systems on all data displays.


TecView BT Analysis

The Analysis module enables the user to analyze the Bond Testing Data once it is tagged and stored. Various C-Scan representations can be displayed based on different amplitude and phase combinations. TecView™ BT makes it easy to display relevant Impedance plots and triggered alarms by the simple movement of the cursor along a C-Scan section


 


Software Features:

  • Imaging and Analysis module
  • Real-time impedance and C-Scan display
  • Resonance and MIA modes
  • Live Alarms utilities
  • Post-processing re-nulling and rotations
  • Impedance components C-Scan imaging (amplitude, phase, etc.)
  • Alarm based C-Scan imaging
  • 3D projection for better illustration of defects
  • Reporting capabilities
  • Intuitive user-interface & menu

The automated bond testing solution consists of Automated Scanner, TecView™ BT, PC workstation & bond testing instrument

Typical Scanner Specifications

Scan Resolution 0.0005″/Step (0.0127mm/Step)
Index Resolution 0.005″/Index (0.127mm/Index)
Scanner Speed
(X & Y Axes)
10″/Sec (254mm/Sec)
Scanning Rate 5KHz
Minimum Curvature Radius 14″ (350mm)

TecView™ BT specifications

  • Complete multi-tasking software
  • Windows® based user-friendly interface
  • Logon screen with administrator access and limited user accounts
  • Full control of hardware settings, scanner motion and data acquisition
  • Full impedance plot recording
  • Independent Inspection and Analysis modules
  • Inspection and data analysis can be done concurrently
  • Motion control of 3 axes
  • Scan pause and resume option
  • Home and re-scan capabilities
  • Real-time impedance components and C-Scans
  • Absolute amplitude display, H-component, V-component & phase angle
  • Multiple C-Scan and Strip Chart representations
  • C-Scan enhancement utilities
  • Alarm selection
  • Image processing utilities
  • Reporting capabilities
  • Annotations tools
  • Zooming capabilities
  • Lookup table, linear, logarithmic or scaled
  • Custom reporting capabilities
  • Imperial and metric units

* the scanner includes all motor drives and required electronic components, wiring and cables.

PC Workstation

  • Industrial rugged laptop
  • 2 Channels, 12/14 bit High Speed Digitizer

Bond Testers compatibility

  • BondMaster from Olympus
  • Bondascope 3100
  • Bond testers from other Manufacturer

*These specifications may vary according to clients requirements.

Related Videos

TecView BT
TecView BT
TecView BT Software.pdf
1.7 MiB
756 Downloads
Details

Non-destructive Bond Testing Software

Languages:English
Author:TecScan
Platforms:Windows 7
Category:brochures library
License:Freeware
Date:April 23, 2015

 

C-Scan Imaging for Bond Testing Inspection
C-Scan Imaging for Bond Testing Inspection
ReneSicard - Paper Airworthiness 2010 - Bond Testing.pdf
1.0 MiB
1805 Downloads
Details

Automated non-destructive C-Scan imaging for bond testing of composites

Languages:English
Author:TecScan
Platforms:Windows 7
Category:Articles
License:Freeware
Date:April 23, 2015
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